Title :	Nano-scale nucleation of defect in strained silicon chip : a research report
Material Type:	printed text
Authors:	S. K. Lamichhane, Author
Publisher:	Kathmandu : NAST
Publication Date:	2011
Pagination:	32 p.
General note:	' Submitted to Nepal Academy of Science And Technology (NAST) Khumaltar, Lalitpur Nepal By Shobha Kanta Lamichhane Department of Physics, Prithwi Narayan Campus, Pokhara Tribhuvan University
Languages :	English (eng)
Link for e-copy:	http://elibrary.nast.gov.np/dl/?r=85

Nano-scale nucleation of defect in strained silicon chip : a research report [printed text] / S. K. Lamichhane, Author . - Kathmandu : NAST, 2011 . - 32 p.
'
Submitted to
Nepal Academy of Science And Technology (NAST)
Khumaltar, Lalitpur
Nepal
By
Shobha Kanta Lamichhane
Department of Physics, Prithwi Narayan Campus, Pokhara
Tribhuvan University

Languages : English (eng)

Link for e-copy:

http://elibrary.nast.gov.np/dl/?r=85